An X-ray spectromicroscopic study of electromigration in patterned Al(Cu) lines

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Date
1999Author
Solak, Harun H.
Lorusso, GianFranco
Singh-Gasson, Sangeet
Cerrina, Francesco
Publisher
American Institute of Physics
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http://digital.library.wisc.edu/1793/9092Description
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Citation
The following article appeared in Solak, H.H., Lorusso, G.F.S.G.S., & Cerrina, F. (1999). An X Ray Spectromicroscopic Study Of Electromigration In Patterned Al(Cu) Lines. Applied Physics Letters, 74(1), 22-4. and may be found at http://link.aip.org/link/?apl/74/22