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dc.contributor.authorAuciello, Orlandoen_US
dc.contributor.authorEom, Chang-Beomen_US
dc.contributor.authorStreiffer, Stephen K.en_US
dc.contributor.authorBai, Guo-Renen_US
dc.contributor.authorEastman, Jeffrey A.en_US
dc.contributor.authorGhosh, Kartik C.en_US
dc.contributor.authorStephenson, G. Brianen_US
dc.contributor.authorLee, Mark K.en_US
dc.contributor.authorThompson, Carolen_US
dc.contributor.authorMunkholm, Annelien_US
dc.date.accessioned2007-07-13T19:16:36Z
dc.date.available2007-07-13T19:16:36Z
dc.date.issued2001en_US
dc.identifier.citationThe following article appeared in Thompson, C., Munkholm, A., Streiffer, S.K., Stephenson, G.B., Ghosh, K., Eastman, J.A., et al. (2001). X Ray Scattering Evidence For The Structural Nature Of Fatigue In Epitaxial Pb(Zr, Ti)O 3 Films. Applied Physics Letters, 78(22), 3511-3513. and may be found at http://link.aip.org/link/?apl/78/3511en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8898
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent46714 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdfen_US
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://apl.aip.org/en_US
dc.rightsCopyright 2001 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleX-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O-3 filmsen_US


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