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Enhanced sensitivity beam emission spectroscopy system for nonlinear turbulence measurements

Gupta, Deepak K.; Fonck, Raymond J.; McKee, George R.; Schlossberg, David J.; Shafer, Morgan W. (American Institute of Physics Inc., Melville, NY 11747-4502, United States, 2004)

Turbulence velocimetry of density fluctuation imaging data

McKee, George R.; Fonck, Raymond J.; Gupta, Deepak K.; Schlossberg, David J.; Shafer, Morgan W.; Holland, Christopher; Tynan, George R. (American Institute of Physics Inc., Melville, NY 11747-4502, United States, 2004)