Browsing College of Engineering Publications by Title
Now showing items 109-128 of 1369
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C-V profiling of GaAs FET films
(1978) -
Cache profiling and the SPEC benchmarks: A case study
(IEEE, Piscataway, NJ, USA, 1994) -
Calculation of interfacial tension from density of states
(American Institute of Physics Inc, 2003) -
Calculations of neoclassical viscous damping on flux surfaces near magnetic islands in the helically symmetric experiment
(American Institute of Physics, 2005) -
Calibration of Ir-192 High-Dose-Rate Afterloading Systems
(American Institute of Physics, 1991) -
Canine sternal force-displacement relationship during cardiopulmonary resuscitation
(IEEE, Piscataway, NJ, USA, 1999) -
Canonical space-time characterization of mobile wireless channels
(Institute of Electrical and Electronics Engineers Inc., Piscataway, NJ, USA, 1999) -
Canonical space-time processing for wireless communications
(Institute of Electrical and Electronics Engineers Inc., Piscataway, NJ, USA, 2000) -
Cantilever tilt compensation for variable-load atomic force microscopy
(American Institute of Physics, 2005) -
Capacity scaling and spectral efficiency in wide-band correlated MIMO channels
(Institute of Electrical and Electronics Engineers Inc, 2003) -
Carbon-doped M9B2 thin films grown by hybrid physical-chemical vapor deposition
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2005) -
Case for direct-mapped caches
(1988) -
Case for relative differentiated services and the proportional differentiation model
(Institute of Electrical and Electronics Engineers Inc., Piscataway, NJ, USA, 1999) -
Challenges in computer architecture evaluation
(IEEE COMPUTER SOC, 2003) -
Changing photoluminescence intensity from GaAs/Al0.3Ga0.7As heterostructures upon chemisorption of SO2
(American Inst of Physics, Woodbury, NY, USA, 1995) -
Characteristics of GaAsNGaAsSb type-II quantum wells grown by metalorganic vapor phase epitaxy on GaAs substrates
(American Institute of Physics Inc., Melville, NY 11747-4502, United States, 2005) -
Characterization of a silicon-based shear-force sensor on human subjects
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2002) -
Characterization of individual filaments extracted from a Bi-2223/Ag tape
(IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 2003) -
Characterization of laser produced tetrakis (dimethylamino) ethylene plasma in a high-pressure background gas
(Institute of Electrical and Electronics Engineers Inc., Piscataway, United States, 2004)