Browsing College of Engineering Publications by Title
Now showing items 1361-1369 of 1369
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X-ray microdiffraction study of Cu interconnects
(American Institute of Physics Inc, 2000) -
X-ray photoelectron spectroscopic study on sapphire nitridation for GaN growth by hydride vapor phase epitaxy: Nitridation mechanism
(American Institute of Physics Inc, 2003) -
X-ray photoemission determination of the Schottky barrier height of metal contacts to n-GaN and p-GaN
(American Institute of Physics Inc, 2002) -
X-ray photoemission spectroscopic investigation of surface treatments, metal deposition, and electron accumulation on InN
(American Institute of Physics Inc, 2003) -
X-ray scattering evidence for the structural nature of fatigue in epitaxial Pb(Zr, Ti)O-3 films
(American Institute of Physics, 2001) -
An X-ray spectromicroscopic study of electromigration in patterned Al(Cu) lines
(American Institute of Physics, 1999) -
Yield-driven, false-path-aware clock skew scheduling
(Institute of Electrical and Electronics Engineers Computer Society, Piscataway, NJ 08855-1331, United States, 2005)