4-Point Resistivity Measurements of Silicon-Carbide Nanowires

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Date
2015-04
Author
Steinke, Kelsey
Kohl-Blomsness, Nokoma
Tollefson, Kyle
Advisor(s)
Dunham, Doug J.
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Abstract
The purpose of this study was to the electrical properties of silicon carbide nanowires, specifically resistivity, as well as being able to control the resistivity of the wires to make electrical devices.
Subject
Silicon carbide
Nanowires
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http://digital.library.wisc.edu/1793/74818
Type
Presentation
Description
Color poster with text, photographs, images, and charts.
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