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dc.contributor.authorRickert, Kimberly Anneen_US
dc.contributor.authorEllis, Arthur B.en_US
dc.contributor.authorHimpsel, Franz J.en_US
dc.contributor.authorLu, Haien_US
dc.contributor.authorSchaff, Williamen_US
dc.contributor.authorRedwing, Joan M.en_US
dc.contributor.authorDwikusuma, Fransiskaen_US
dc.contributor.authorKuech, Thomas F.en_US
dc.date.accessioned2007-07-13T19:29:32Z
dc.date.available2007-07-13T19:29:32Z
dc.date.issued2003en_US
dc.identifier.citationThe following article appeared in Rickert, K.A., Ellis, A.B., Himpsel, F.J., Lu, H., Schaff, W., Redwing, J.M., et al. (2003). X Ray Photoemission Spectroscopic Investigation Of Surface Treatments, Metal Deposition, And Electron Accumulation On In N. Applied Physics Letters, 82(19), 3254-3256. and may be found at http://link.aip.org/link/?apl/82/3254en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/10606
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent48133 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.publisherAmerican Institute of Physics Incen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://apl.aip.org/en_US
dc.rightsCopyright 2003 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleX-ray photoemission spectroscopic investigation of surface treatments, metal deposition, and electron accumulation on InNen_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.1573351en_US


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